Title :
MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation
Author :
Kerkhoff, Hans ; Tangelder, Ronald ; Speek, Han ; Engin, Nur
Author_Institution :
MESA Res. Inst., Twente Univ., Enschede, Netherlands
Abstract :
This paper describes a tool which assists the designer in the rapid generation of functional tests for mixed-signal circuits down to the actual test-signals for the tester. The tool is based on manipulating design data, making use of macro-based test libraries and tester resources provided by the test engineer, and computer-based interaction with the designer
Keywords :
automatic test software; circuit CAD; integrated circuit testing; mixed analogue-digital integrated circuits; ATPG; CAD; CAT; MISMATCH; computer-based interaction; design data manipulation; functional tests; macro-based test libraries; mixed-signal circuit testing; mixed-signal test-pattern generation; tester resources; Circuit testing; Data engineering; Design automation; Design engineering; Discrete event simulation; Libraries; Signal design; Signal generators; System testing; Timing;
Conference_Titel :
Electronics, Circuits, and Systems, 1996. ICECS '96., Proceedings of the Third IEEE International Conference on
Conference_Location :
Rodos
Print_ISBN :
0-7803-3650-X
DOI :
10.1109/ICECS.1996.584606
