• DocumentCode
    3464513
  • Title

    Electrical instabilities in stationary contacts: Al/Al and Al/brass junctions

  • Author

    Timsit, R.S.

  • Author_Institution
    Alcan Int. Ltd., Kingston, Ont., Canada
  • fYear
    1988
  • fDate
    26-29 Sept. 1988
  • Firstpage
    151
  • Lastpage
    165
  • Abstract
    Electrical instabilities in Al/Al and Al/brass stationary point junctions has been examined in ultrahigh vacuum and in oxygen gas. It is found that Al/brass junctions are electrically stable in vacuum and in oxygen gas if the surfaces are sufficiently clean. The growth of intermetallic compounds in this interface affects stability only after a sufficiently long exposure of the contact, typically several hours, to a temperature typically higher than 150 degrees C. Surface contaminants, probably in the form of carbonaceous material, are deleterious to the performance of Al/Al and Al/brass junctions. However, the junctions often recover from contaminant-induced degeneration. This recovery is attributed in part to thermal dispersal of the contaminants from the electrical interface during the early stages of degeneration.<>
  • Keywords
    aluminium; brass; electrical contacts; Al-Al contacts; Al-CuZn contacts; O/sub 2/ atmosphere; carbonaceous material; contaminant-induced degeneration; electrical instabilities surface contaminants; growth of intermetallic compounds; junction recovery; long exposure; stationary contacts; stationary point junctions; ultrahigh vacuum; Aluminum; Artificial intelligence; Contacts; Creep; Degradation; Intermetallic; Oxidation; Surface cleaning; Surface contamination; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/HOLM.1988.16111
  • Filename
    16111