• DocumentCode
    3464576
  • Title

    TD: MOS Medley

  • Author

    Gulak, Glenn ; Weber, Werner

  • Author_Institution
    University of Toronto, Toronto, Canada
  • fYear
    2008
  • fDate
    3-7 Feb. 2008
  • Firstpage
    328
  • Lastpage
    329
  • Keywords
    CMOS process; CMOS technology; Capacitance measurement; Capacitive sensors; Displacement measurement; Integrated circuit measurements; Microorganisms; Noise measurement; Paper technology; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4244-2010-0
  • Electronic_ISBN
    978-1-4244-2011-7
  • Type

    conf

  • DOI
    10.1109/ISSCC.2008.4523190
  • Filename
    4523190
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3464576