Title :
Manufacturing yield ramp-up methodology for advanced technology
Author :
Kuei, Johnny ; Weng, Yulei ; Li, Jianxun ; Schmidt, Andreas ; Daldoss, Lidia ; Gardner, James
Abstract :
In this paper, we present an integrated yield ramp approach with short loop and precise yield modeling. The short loop allows quicker cycle time and overall yield ramp up to world class yield level with above industry average arima learning rate. In order for the short loop to be an effective vehicle, it must cover the entire design and process space and provide accurate fail rate
Keywords :
manufacturing processes; advanced technology; cycle time; manufacturing yield ramp-up methodology; short loop; Degradation; Inspection; Observability; Process design; Product design; Pulp manufacturing; Space technology; Space vehicles; System testing; Virtual manufacturing;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
DOI :
10.1109/ICSICT.2006.306336
