Title :
EFT/B immunity test conditions of telecommunication equipment using ISDN basic interfaces
Author :
Kanno, Shin ; Miyashita, Seiichi ; Hiroshima, Yoshiharu
Author_Institution :
NTT Multimedia Networks Labs., Tokyo, Japan
Abstract :
Test conditions are significant factors in testing such as the sweep rate in conducted continuous wave immunity testing, or the duration of impress bursts in EFT/B immunity testing. The effects of various impressed waveforms were measured. Determination of waveform generating parameters for basic ISDN telecommunications equipment is discussed. Communication method of basic ISDN telecommunication equipment is investigated as to physical, data link, and network layers. The most suitable waveform for a basic ISDN interface is discussed
Keywords :
ISDN; electromagnetic interference; protocols; telecommunication equipment testing; EFT/B immunity test conditions; ISDN basic interfaces; ISDN telecommunications equipment; conducted continuous wave immunity testing; data link layer; impress bursts; network layer; physical layer; sweep rate; telecommunication equipment; test conditions; waveform generating parameters; Degradation; IEC standards; IP networks; ISDN; Immunity testing; Protocols; Pulse measurements; Throughput; Time measurement; Web and internet services;
Conference_Titel :
Electromagnetic Compatibility, 1999 International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
4-9980748-4-9
DOI :
10.1109/ELMAGC.1999.801266
