Title :
Rating EMC parameters of microelectronic systems maintaining safety in response to actual electromagnetic environment
Author :
Bochkov, K.A. ; Ryazantseva, N.V. ; Lisenkov, V.M.
Author_Institution :
Belorussian State Transp. Univ., Gomel, Russia
Abstract :
The report deals with the development of a new method of rating EMC parameters of microelectronic safety systems using the probability approach as recommended by the IEC 610000-401 Guides. EMC parameters are rated using the probabilistic criteria of EMC levels assumed as a numerical value of failure probability. For user´s convenience an EMCpar package in the Windows environment has been devised allowing to determine noise and noise immunity levels to be rated at specified EMC standards. The new method is better tailored to the task because it allows to determine EMC parameters to be rated according to the specified standards of reliable and safe performance of microelectronic systems
Keywords :
IEC standards; electrical engineering computing; electromagnetic compatibility; integrated circuit reliability; safety systems; software packages; EMC parameters; EMC standards; EMCpar package; IEC 610000-401 Guides; electromagnetic environment; failure probability; microelectronic systems; noise immunity levels; probabilistic criteria; probability approach; rating; safety; Electromagnetic compatibility; Electromagnetic interference; Failure analysis; IEC standards; Immunity testing; Microelectronics; Noise level; Safety; System testing; Working environment noise;
Conference_Titel :
Electromagnetic Compatibility, 1999 International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
4-9980748-4-9
DOI :
10.1109/ELMAGC.1999.801401
