Title :
Directional mean shift and its application for topology classification of local 3D structures
Author :
Kafai, Mehran ; Miao, Yiyi ; Okada, Kazunori
Author_Institution :
Comput. Sci. Dept., UC Riverside, Riverside, CA, USA
Abstract :
In this study, we introduce a new directional nonparametric clustering algorithm for 3D medical structure topology classification. This paper proposes directional mean shift (DMS) which extends the well known mean shift-based clustering, for handling directional statistics, toward analyzing directional/circular-domain data with phase-wraparound boundary conditions. Our overall approach transforms the 3D topology classification problem into a clustering analysis of a 2D image, following the work by Bahlmann et al. in the context of computer-aided diagnosis (CAD). The proposed DMS replaces the expectation-maximization (EM) algorithm for Gaussian mixture model (GMM) fitting used in the previous method addressing the shortcomings of the Bahlmann´s method. Results from our experiments demonstrate the effectiveness of DMS in contrast to the original EM-based approach in solving the clustering problem with a 2D image unwrapped from a 3D spherical data, leading to better accuracy in the topology classification task.
Keywords :
Gaussian processes; computerised tomography; expectation-maximisation algorithm; image classification; medical image processing; 2D image clustering analysis; 3D medical structure topology classification; 3D spherical data; Bahlmann method; Gaussian mixture model fitting; computer-aided diagnosis; directional mean shift; directional nonparametric clustering algorithm; directional statistics; directional/circular-domain data; expectation-maximization algorithm; local 3D structures; mean shift-based clustering; phase-wraparound boundary condition; topology classification task; Biomedical imaging; Clustering algorithms; Computer science; Data analysis; Image analysis; Image color analysis; Medical diagnostic imaging; Statistical analysis; Statistics; Topology;
Conference_Titel :
Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-7029-7
DOI :
10.1109/CVPRW.2010.5543591