DocumentCode :
3465103
Title :
Study on dynamic characterization of a shunt capacitive RF MEMS switch
Author :
Hou, Zhihao ; Liu, Zewen ; Lei, Xiaofeng ; Hu, Guangwei ; Liu, Litian ; Li, Zhijian
Author_Institution :
Dept. of Microelectron. & Nanoelectron., Tsinghua Univ., Beijing
fYear :
2006
fDate :
Oct. 2006
Firstpage :
584
Lastpage :
586
Abstract :
Method and result of dynamic characterization of a shunt capacitive RF MEMS switch is presented. The measurement system is based on an optical surface profiler, using which the displacement and action time can be obtained directly. The main structure of the RF MEMS switch is consisted of metallic membrane and serpentine support beams. It has very good isolation up to 46dB @19.6GHz. Measurement results show that the whole action time of the fabricated RF MEMS switch is in order of 100mus, and the pull-down time is 20mus, the recover time is about 80mus
Keywords :
microswitches; microwave switches; 100 mus; 19.6 GHz; 20 mus; metallic membrane; optical surface profiler; serpentine support beams; shunt capacitive RF MEMS switch; Biomembranes; Communication switching; Electrodes; Electrostatic measurements; Optical switches; Radio frequency; Radiofrequency microelectromechanical systems; Telecommunication switching; Time measurement; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
Type :
conf
DOI :
10.1109/ICSICT.2006.306382
Filename :
4098174
Link To Document :
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