DocumentCode
3465121
Title
Comparative surface investigations at spherical Si surfaces using optical and X-ray techniques
Author
Busch, I. ; Fuchs, P. ; Krumrey, M. ; Kuetgens, U.
Author_Institution
Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany
fYear
2010
fDate
13-18 June 2010
Firstpage
494
Lastpage
495
Abstract
Currently options for a new definition of the kilogram on the basis of invariants of nature are under investigations. One of the most promising approaches uses the mass of 12C. Within the framework of the Avogadro project the scaling factor between atomic mass units and macroscopic mass, the Avogadro constant NA, will be measured with a relative standard uncertainty 2·10-8, to enable this type of realization.
Keywords
X-ray optics; atom optics; elemental semiconductors; optical constants; silicon; Avogadro constant; Avogadro project; Si; X-ray techniques; atomic mass units; comparative surface investigations; macroscopic mass; optical techniques; scaling factor; spherical surfaces; Atomic measurements; Calibration; Chemical elements; Contamination; Instruments; Pollution measurement; Reflectometry; Surface topography; Thickness measurement; Volume measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location
Daejeon
Print_ISBN
978-1-4244-6795-2
Type
conf
DOI
10.1109/CPEM.2010.5543604
Filename
5543604
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