• DocumentCode
    3465121
  • Title

    Comparative surface investigations at spherical Si surfaces using optical and X-ray techniques

  • Author

    Busch, I. ; Fuchs, P. ; Krumrey, M. ; Kuetgens, U.

  • Author_Institution
    Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    494
  • Lastpage
    495
  • Abstract
    Currently options for a new definition of the kilogram on the basis of invariants of nature are under investigations. One of the most promising approaches uses the mass of 12C. Within the framework of the Avogadro project the scaling factor between atomic mass units and macroscopic mass, the Avogadro constant NA, will be measured with a relative standard uncertainty 2·10-8, to enable this type of realization.
  • Keywords
    X-ray optics; atom optics; elemental semiconductors; optical constants; silicon; Avogadro constant; Avogadro project; Si; X-ray techniques; atomic mass units; comparative surface investigations; macroscopic mass; optical techniques; scaling factor; spherical surfaces; Atomic measurements; Calibration; Chemical elements; Contamination; Instruments; Pollution measurement; Reflectometry; Surface topography; Thickness measurement; Volume measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2010 Conference on
  • Conference_Location
    Daejeon
  • Print_ISBN
    978-1-4244-6795-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2010.5543604
  • Filename
    5543604