Title :
SE6: Highlights of IEDM 2007
Author :
Theuwissen, Albert ; Thewes, Roland ; Perea, Ernesto
Author_Institution :
Delft University of Technology, Delft, Netherlands/Harvest Imaging, Bree, Belgium
Abstract :
Presents panel discussions from the conference proceedings.
Conference_Titel :
Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-2010-0
DOI :
10.1109/ISSCC.2008.4523222