Title :
Razor II: In Situ Error Detection and Correction for PVT and SER Tolerance
Author :
Blaauw, David ; Kalaiselvan, Sudherssen ; Lai, Kevin ; Ma, Wei-Hsiang ; Pant, Sanjay ; Tokunaga, Carlos ; Das, Shidhartha ; Bull, David
Author_Institution :
Univ. of Michigan, Ann Arbor, MI
Abstract :
We take advantage of these findings and propose a Razor II approach that introduces two components. First, instead of performing both error detection and correction in the FF, Razor II performs only detection in the FF, while correction is performed through architectural replay.
Keywords :
error correction; error detection; PVT tolerance; Razor II; SER tolerance; error correction; error detection; Clocks; Error analysis; Error correction; Frequency; Microprocessors; Phase detection; Pipelines; Solid state circuits; Testing; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-2010-0
Electronic_ISBN :
978-1-4244-2011-7
DOI :
10.1109/ISSCC.2008.4523226
