DocumentCode :
3465310
Title :
Progress on the von Klitzing constant determination at LNE
Author :
Gournay, P. ; Thévenot, O. ; Dupont, L. ; Lahousse, L. ; Piquemal, F.
Author_Institution :
LNE, Trappes, France
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
492
Lastpage :
493
Abstract :
In late 2005, LNE started a new project of determination of the phenomenological von Klitzing constant RK with a target relative overall uncertainty of 10-8. In this paper, we report the current state of this project.
Keywords :
assembling; capacitors; constants; indeterminancy; Lampard capacitor mechanical structure; Rk determination; VON KLITZING constant determination; assembling; mechanical structure; target relative overall uncertainty; Bridge circuits; Capacitors; Electrodes; Electromagnetic measurements; Electrons; Hall effect; Lapping; Quantum mechanics; Shape; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
Type :
conf
DOI :
10.1109/CPEM.2010.5543619
Filename :
5543619
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3465310
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