DocumentCode :
3465354
Title :
Color image quality metric S-CIELAB and its application on halftone texture visibility
Author :
Xuemei Zhang ; Silverstein, D.A. ; Farrell, J.E. ; Wandell, B.A.
Author_Institution :
Dept. of Psychol., Stanford Univ., CA, USA
fYear :
1997
fDate :
23-26 Feb. 1997
Firstpage :
44
Lastpage :
48
Abstract :
We describe experimental tests of a spatial extension to the CIELAB color metric for measuring color reproduction errors of digital images. The standard CIELAB /spl Delta/E metric is suitable for use on large uniform color targets, but not on images, because color sensitivity changes as a function of spatial pattern. The S-CIELAB extension includes a spatial processing step, prior to the CIELAB /spl Delta/E calculation, so that the results correspond better to color difference perception by the human eye. The S-CIELAB metric was used to predict texture visibility of printed halftone patterns. The results correlate with perceptual data better than standard CIELAB and point the way to various improvements.
Keywords :
colour graphics; image colour analysis; image texture; CIELAB color metric; color difference perception; color image quality metric S-CIELAB; color reproduction error measurement; color sensitivity; digital images; halftone texture visibility; human eye; large uniform color targets; perceptual data; printed halftone patterns; spatial extension; spatial pattern; spatial processing step; standard CIELAB /spl Delta/E metric; texture visibility; Color; Digital images; Filtering; Hardware; Humans; Laboratories; Milling machines; Nonlinear filters; Psychology; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compcon '97. Proceedings, IEEE
Conference_Location :
San Jose, CA, USA
ISSN :
1063-6390
Print_ISBN :
0-8186-7804-6
Type :
conf
DOI :
10.1109/CMPCON.1997.584669
Filename :
584669
Link To Document :
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