DocumentCode
3465403
Title
Electron counting capacitance standard : Progress report
Author
Rüfenacht, A. ; Jeanneret, B. ; Lotkhov, S.V.
Author_Institution
Fed. Office of Metrol. METAS, Bern-Wabern, Switzerland
fYear
2010
fDate
13-18 June 2010
Firstpage
498
Lastpage
499
Abstract
The electron counting capacitance standard is a challenging experiment in attempt to close the metrological triangle with a sub-ppm uncertainty. This progress report describes the status of the METAS activities in this field. A new single electron transistor bias electronics has been developed and characterized by noise measurement using Allan deviation. In addition, SET electrometers were characterized, demonstrating the functionality of the setup.
Keywords
counting circuits; electrometers; noise measurement; single electron transistors; Allan deviation; SET electrometer; electron counting capacitance standard; metrological triangle; noise measurement; single electron transistor bias electronics; Capacitance; Circuit testing; Current measurement; Electrons; Monitoring; Noise measurement; Performance evaluation; Sampling methods; Transconductance; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location
Daejeon
Print_ISBN
978-1-4244-6795-2
Type
conf
DOI
10.1109/CPEM.2010.5543625
Filename
5543625
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