Title :
Electron counting capacitance standard : Progress report
Author :
Rüfenacht, A. ; Jeanneret, B. ; Lotkhov, S.V.
Author_Institution :
Fed. Office of Metrol. METAS, Bern-Wabern, Switzerland
Abstract :
The electron counting capacitance standard is a challenging experiment in attempt to close the metrological triangle with a sub-ppm uncertainty. This progress report describes the status of the METAS activities in this field. A new single electron transistor bias electronics has been developed and characterized by noise measurement using Allan deviation. In addition, SET electrometers were characterized, demonstrating the functionality of the setup.
Keywords :
counting circuits; electrometers; noise measurement; single electron transistors; Allan deviation; SET electrometer; electron counting capacitance standard; metrological triangle; noise measurement; single electron transistor bias electronics; Capacitance; Circuit testing; Current measurement; Electrons; Monitoring; Noise measurement; Performance evaluation; Sampling methods; Transconductance; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5543625
