Title :
Single photon counting with two quantum dots capacitively coupled
Author :
Troudi, M. ; Sghaier, Na ; Boubaker, A. ; Kalboussi, A. ; Souifi, A.
Author_Institution :
Lab. de Microelectron. et Instrum., Fac. des Sci. de Monastir, Monastir
Abstract :
In this work, we propose a concept of Single Electron Photo-detector (Photo-SET) able to detect one by one electron. This photo-SET consists of two blocs (reading and detection blocs) that operate simultaneously. From simulations results we determine the effects of photoexcitation on Id-Vg curves, and we present results obtained on the output photo-SET characteristics after variation of power illumination and wavelength. However, the photo-SET has the highest charge sensitivity of any electronic device. There are two disadvantages to this situation. First, the noise level is significantly higher at low frequencies, so it is necessary to do a lot of signal averaging to obtain clean data. Second, low frequencies are unsuitable for experiments on phenomena that are susceptible to signal degradation due to leakage or decay. In order to eliminate the effect of distortion due to a background charge, we show how to correct the effect of parasitic charge on the proposed model.
Keywords :
photodetectors; semiconductor device noise; semiconductor quantum dots; single electron transistors; Id-Vg curves; capacitively coupled quantum dots; charge sensitivity; distortion effect; noise level; photoexcitation; power illumination; signal averaging; single electron photodetector; single electron transistor; single photon counting; Demultiplexing; Glass; Optical devices; Optical fiber communication; Optical fibers; Optical filters; PIN photodiodes; Plasma temperature; Quantum dots; Wavelength division multiplexing; Light excitation; Photodetector; Quantum dots (QD); Single Electron Transistor (SET); parasitic charge;
Conference_Titel :
Systems, Signals and Devices, 2009. SSD '09. 6th International Multi-Conference on
Conference_Location :
Djerba
Print_ISBN :
978-1-4244-4345-1
Electronic_ISBN :
978-1-4244-4346-8
DOI :
10.1109/SSD.2009.4956662