DocumentCode
3465568
Title
Medical Volume Noise Reduction Employing a Laplace Distribution with Local Variance for Modeling Contourlet Coefficients
Author
Rabbani, H. ; Vafadust, M. ; Gazor, S.
Author_Institution
Amirkabir Univ. of Technol., Tehran
fYear
2007
fDate
19-22 Aug. 2007
Firstpage
107
Lastpage
110
Abstract
In this paper we introduce a simple shrinkage function employing local Laplace distribution for medical volume noise reduction in contourlet transform domain. Since we implement our denoising algorithm in contourlet domain, we are able to preserve the important details of noise-free images that for medical volume may contain important diagnostic information. It is clear that using maximum a posteriori (MAP) estimator for denoising problem, needs a prior distribution for noise-free data. In this paper we propose a Laplace probability density function (pdf) to model the statistical properties of contourlet coefficients. This distribution is able to simultaneously model the heavy-tailed nature and spatially clustering property of coefficients. We use the produced thresholding function from MAP estimator for denoising of a sequence of CT images corrupted with additive Gaussian noise in various noise levels. The simulation results show that our method has better performance visually and in terms of peek signal-to-noise ratio (PSNR) in comparison with several denoising methods.
Keywords
Gaussian noise; image denoising; maximum likelihood estimation; medical image processing; statistical distributions; Gaussian noise; Laplace distribution; contourlet coefficients; diagnostic information; local variance; maximum a posteriori estimator; medical volume noise reduction; probability density function; shrinkage function; Additive noise; Biomedical imaging; Computed tomography; Gaussian noise; Medical diagnostic imaging; Noise level; Noise reduction; PSNR; Probability density function; Signal to noise ratio;
fLanguage
English
Publisher
ieee
Conference_Titel
Medical Devices and Biosensors, 2007. ISSS-MDBS 2007. 4th IEEE/EMBS International Summer School and Symposium on
Conference_Location
Cambridge
Print_ISBN
978-1-4244-1346-1
Electronic_ISBN
978-1-4244-1346-1
Type
conf
DOI
10.1109/ISSMDBS.2007.4338304
Filename
4338304
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