Title :
Functional verification of the superscalar SH-4 microprocessor
Author :
Biswas, P. ; Freeman, A. ; Yamada, K. ; Nakagawa, N. ; Uchiyama, K.
Author_Institution :
Hitachi Microsyst. Inc., San Jose, CA, USA
Abstract :
Functional verification of modern complex processors is a formidable and time consuming task. In spite of substantial manual effort, it is extremely difficult to systematically cover the corner cases of the control logic design, within a short processor design cycle. The SH4 processor is a dual issue superscalar RISC architecture with extensive hardware support for 3D graphics. We present the development of a semi automated methodology for functional verification. In particular, we elaborate a scheme to automatically generate test programs to verify the superscalar issue logic, bypass/multi bypass logic and stall logic, starting from the microarchitectural specification. Finally, we present the Random Test Generation methodology and the specific Random Test Generators.
Keywords :
automatic programming; computer testing; formal verification; integrated circuit testing; logic design; reduced instruction set computing; 3D graphics; Random Test Generation methodology; Random Test Generators; SH4 processor; automatic test program generation; bypass/multi bypass logic; control logic design; dual issue superscalar RISC architecture; functional verification; hardware support; microarchitectural specification; modern complex processors; semi automated methodology; short processor design cycle; stall logic; superscalar SH-4 microprocessor; superscalar issue logic; Automatic control; Automatic logic units; Control systems; Graphics; Hardware; Logic design; Logic testing; Microprocessors; Process design; Reduced instruction set computing;
Conference_Titel :
Compcon '97. Proceedings, IEEE
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-7804-6
DOI :
10.1109/CMPCON.1997.584682