DocumentCode :
3465613
Title :
Impulse response of GaAs radiation imaging detectors
Author :
Tyazhev, A.V. ; Ryzhov, R.A.
Author_Institution :
Siberian Phys.-Tech. Inst., Tomsk, Russia
fYear :
2005
fDate :
21-22 Oct. 2005
Firstpage :
118
Lastpage :
122
Abstract :
In the paper, the pulse characteristics of the detector structures based on GaAs, compensated by Cr are submitted at impact of alpha particles with energy 5.5 MeV from a source 241Am. Based on analysis of experimental data it is established that under condition of homogeneous distribution of electric field intensity (E) in the detector and value E≤3 kV/cm, the pulse characteristic may be described within the framework of the PNTOZ theory. It is shown that the offered technique can be used for evaluation of distribution uniformity of electric field intensity on the detector thickness and in some cases, for determination of electrophysical parameters of the detector material.
Keywords :
III-V semiconductors; X-ray detection; alpha-particle detection; chromium; gallium arsenide; semiconductor counters; 241Am source; Cr; GaAs radiation imaging detector; PNTOZ theory; X-ray detection; alpha particle; electric field intensity; electrophysical parameters; impulse response; ionizing radiation; pulse characteristics; Alpha particles; Chromium; Gallium arsenide; Pulse measurements; Radiation detectors; Radiation imaging; Semiconductor materials; Semiconductor radiation detectors; X-ray detection; X-ray detectors; GaAs; imaging detector; ionizing radiation; pulse response;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Communications, 2005. SIBCON '05. IEEE International Siberian Conference on
Print_ISBN :
0-7803-9219-1
Type :
conf
DOI :
10.1109/SIBCON.2005.1611205
Filename :
1611205
Link To Document :
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