DocumentCode
3465727
Title
Measurement system for high current shunts DC characterization at CMI
Author
Zachovalova, V. Novakova ; Sira, M. ; Streit, J. ; Indra, L.
Author_Institution
Czech Metrol. Inst., Brno, Czech Republic
fYear
2010
fDate
13-18 June 2010
Firstpage
607
Lastpage
608
Abstract
This paper describes a measurement system for DC characterization of high current shunts (below 0,1 Ω) in wide current level (from 5 A up to 100 A) built at CMI. DC characterization of such shunt includes direct resistance measurements, temperature coefficient and power coefficient measurement with uncertainties at ppm level.
Keywords
measurement systems; direct resistance measurement; high current shunt DC characterization; measurement system; power coefficient measurement; temperature coefficient measurement; Calibration; Current measurement; Electrical resistance measurement; Electromagnetic measurements; Measurement standards; Narrowband; Petroleum; Power measurement; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location
Daejeon
Print_ISBN
978-1-4244-6795-2
Type
conf
DOI
10.1109/CPEM.2010.5543643
Filename
5543643
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