• DocumentCode
    3466088
  • Title

    Calculation of DC arc plasma torch current-voltage characteristics

  • Author

    Djebarni, L. ; Mebdoua, Y. ; Lahmar, H.

  • Author_Institution
    Centre de Dev. des Technol., Algiers, Algeria
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Plasma spraying is mainly employed for surface treatment providing coating for protection of materials against wear, erosion and corrosion. Improving coating quality requires a better understanding of the behavior of the arc created inside the direct current arc plasma torches. The present work is devoted to the determination of plasma torch parameters using an analytical calculation on the cathode spot parameters. A model of a heat transfer in the cathode spot on an electrode in the arc discharge is developed and analytical expressions for the spot radius and temperature as functions of basic characteristics of the discharge and the electrode material are obtained. The dependence of the spot radius on the time, the cathode drop voltage and current is investigated. The sequence of calculation of voltage-current characteristics of DC arc plasma torch is proposed. It is shown that the Steenbeck model of arc discharge in cylindrical channel makes it possible to carry out this calculation.
  • Keywords
    arcs (electric); heat transfer; plasma torches; plasma transport processes; DC arc plasma torch; Steenbeck model; analytical calculation; arc discharge; cathode drop current; cathode drop voltage; cathode spot parameters; coating quality; corrosion; current-voltage characteristics; cylindrical channel; direct current arc plasma torches; electrode material; erosion; heat transfer; materials protection; plasma spraying; spot radius; spot temperature; surface treatment; wear; Cathodes; Discharges (electric); Equations; Heating; Materials; Mathematical model; Plasmas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference (PPC), 2013 19th IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2158-4915
  • Type

    conf

  • DOI
    10.1109/PPC.2013.6627439
  • Filename
    6627439