• DocumentCode
    3466099
  • Title

    The research on high-voltage measurement

  • Author

    Yang, Chunting ; Cai, Weijian ; Yu, Jing

  • Author_Institution
    Sch. of Inf. & Electron. Eng., Zhejiang Univ. of Sci. & Technol., Hangzhou, China
  • Volume
    2
  • fYear
    2009
  • fDate
    5-6 Dec. 2009
  • Firstpage
    92
  • Lastpage
    95
  • Abstract
    Capacitor voltage transformers (CVT) gradually replace the electromagnetic voltage transformers (EVT) in high-voltage measurements in recent years. But transient process of CVTs is worse. Recently much research work has been focused on improving CVT. In this paper a novel CVT named capacitance-resistance voltage transformer (CRVT) is put forward. Its principle is analyzed, and transient response is investigated. The results show that transient response is improved greatly. Furthermore we analyze the effect of environmental factors on the measurement precision of CRVT. Stray capacitance and temperature are two important environmental factors. Theoretical mode of effects on measurement precision is counted, and some parameters are surveyed. The effects of the stray capacitance and environmental temperature on measurement precision are analyzed, and the quantitative relationships are described. The methods for improving measurement precision are provided. Both theoretical analysis and experimental results show that CRVTs are much better than CVTs.
  • Keywords
    capacitance; transformers; voltage measurement; capacitance-resistance voltage transformer; capacitor voltage transformers; electromagnetic voltage transformers; environmental temperature; high-voltage measurement; stray capacitance; Capacitance; Condition monitoring; Electromagnetic measurements; Environmental factors; Equivalent circuits; Mechanical variables measurement; Power engineering and energy; Power measurement; Temperature; Voltage transformers; capacitance-resistance; high-voltage measurement; measurement precision;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test and Measurement, 2009. ICTM '09. International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-4699-5
  • Type

    conf

  • DOI
    10.1109/ICTM.2009.5412996
  • Filename
    5412996