DocumentCode
3466099
Title
The research on high-voltage measurement
Author
Yang, Chunting ; Cai, Weijian ; Yu, Jing
Author_Institution
Sch. of Inf. & Electron. Eng., Zhejiang Univ. of Sci. & Technol., Hangzhou, China
Volume
2
fYear
2009
fDate
5-6 Dec. 2009
Firstpage
92
Lastpage
95
Abstract
Capacitor voltage transformers (CVT) gradually replace the electromagnetic voltage transformers (EVT) in high-voltage measurements in recent years. But transient process of CVTs is worse. Recently much research work has been focused on improving CVT. In this paper a novel CVT named capacitance-resistance voltage transformer (CRVT) is put forward. Its principle is analyzed, and transient response is investigated. The results show that transient response is improved greatly. Furthermore we analyze the effect of environmental factors on the measurement precision of CRVT. Stray capacitance and temperature are two important environmental factors. Theoretical mode of effects on measurement precision is counted, and some parameters are surveyed. The effects of the stray capacitance and environmental temperature on measurement precision are analyzed, and the quantitative relationships are described. The methods for improving measurement precision are provided. Both theoretical analysis and experimental results show that CRVTs are much better than CVTs.
Keywords
capacitance; transformers; voltage measurement; capacitance-resistance voltage transformer; capacitor voltage transformers; electromagnetic voltage transformers; environmental temperature; high-voltage measurement; stray capacitance; Capacitance; Condition monitoring; Electromagnetic measurements; Environmental factors; Equivalent circuits; Mechanical variables measurement; Power engineering and energy; Power measurement; Temperature; Voltage transformers; capacitance-resistance; high-voltage measurement; measurement precision;
fLanguage
English
Publisher
ieee
Conference_Titel
Test and Measurement, 2009. ICTM '09. International Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-4699-5
Type
conf
DOI
10.1109/ICTM.2009.5412996
Filename
5412996
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