• DocumentCode
    3466975
  • Title

    Clustering support vector machines for unlabeled data classification

  • Author

    Xie, Juanying ; Wang, Chunxia ; Zhang, Yan ; Jiang, Shuai

  • Author_Institution
    Sch. of Comput. Sci., Shaanxi Normal Univ., Xian, China
  • Volume
    2
  • fYear
    2009
  • fDate
    5-6 Dec. 2009
  • Firstpage
    34
  • Lastpage
    38
  • Abstract
    Clustering support vector machines (CSVM) is proposed in this paper for unlabeled data classification. It is often for us to deal with a large number of data which are wholly unlabeled, e.g., classifying them, and it is impractical for us to label these data manually. Clustering algorithms can be used to generate labels for this kind of data. The global k-means clustering algorithm, the fast global k-means algorithm and another global k-means clustering algorithm using k-d trees are combined respectively with the statistical method F-distribution in our paper to generate labels for those wholly unlabeled data, and then the labeled data are trained with SVM for classification. Our proposed approach (CSVM) is tested on four different synthetically generated data sets, which was wholly unlabeled. The experiment results show that our CSVM is efficient to classify the wholly unlabeled data.
  • Keywords
    pattern clustering; statistical distributions; support vector machines; unsupervised learning; F-distribution; clustering algorithms; clustering support vector machines; fast global k-means algorithm; global k-means clustering algorithm; k-d trees k-means clustering algorithm; unlabeled data classification; Classification tree analysis; Clustering algorithms; Computer science; Degradation; Machine learning; Statistical analysis; Statistics; Support vector machine classification; Support vector machines; Testing; fast gobal k-means clustering; global k-means custering; k-d trees; k-means clustering; machine learning; pattern recognition; support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test and Measurement, 2009. ICTM '09. International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-4699-5
  • Type

    conf

  • DOI
    10.1109/ICTM.2009.5413037
  • Filename
    5413037