• DocumentCode
    3467136
  • Title

    Current Discontinuity Character of MSM UV Detector Grown with AlGaN/GaN Multi-quantum Well

  • Author

    Zhou, J. ; Hao, Y.L. ; Yang, Z.J. ; Zhang, G.Y.

  • Author_Institution
    Inst. of Microelectron., Peking Univ., Beijing
  • fYear
    2006
  • fDate
    23-26 Oct. 2006
  • Firstpage
    920
  • Lastpage
    922
  • Abstract
    The oscillation phenomena of current-voltage curves of MSM device grown with AlGaN/GaN multi-quantum well (MQW) interlayer are observed and the pattern of oscillation is related to the sweep voltage. Oscillation phenomena is origin from polarization induced charge resonant tunneling through MQW
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; metal-semiconductor-metal structures; semiconductor quantum wells; ultraviolet detectors; wide band gap semiconductors; AlGaN-GaN; AlGaN/GaN MQW interlayer; AlGaN/GaN multiquantum well; MSM UV detector; MSM device; charge resonant tunneling; current discontinuity character; current-voltage curves; oscillation phenomena; Aluminum gallium nitride; Detectors; Electrons; Gallium nitride; MOCVD; Physics; Polarization; Quantum well devices; Resonant tunneling devices; Superlattices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0160-7
  • Electronic_ISBN
    1-4244-0161-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.2006.306572
  • Filename
    4098277