• DocumentCode
    3467780
  • Title

    New designs for high-resistance standard resistors

  • Author

    Dupree, A.J. ; Jarrett, D.G.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    613
  • Lastpage
    614
  • Abstract
    Discussed are recent efforts undertaken at the National Institute of Standards and Technology (NIST) to create a new set of high-resistance standards (specifically in the 10 MΩ to 100 MΩ range) using newer, more stable film-type resistors. The history of film-type resistors in high-resistance standards is briefly reviewed. Also examined are the improvements made upon similar resistance standard implementations done by the Instituto Nacional de Tecnología Industrial (INTI) in Argentina. The new NIST standards use a guarded, highly resistive backbone to reduce leakage currents. Promising results, including reduced settling time and improved stability, are presented.
  • Keywords
    resistors; Instituto Nacional de Tecnologia Industrial; NIST; National Institute of Standards and Technology; film-type resistors; high-resistance standard resistors; high-resistance standards; Hermetic seals; Leakage current; Measurement standards; Moisture; NIST; Resistors; Spine; Stability; Surface resistance; Video recording;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2010 Conference on
  • Conference_Location
    Daejeon
  • Print_ISBN
    978-1-4244-6795-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2010.5543759
  • Filename
    5543759