DocumentCode
3467780
Title
New designs for high-resistance standard resistors
Author
Dupree, A.J. ; Jarrett, D.G.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
2010
fDate
13-18 June 2010
Firstpage
613
Lastpage
614
Abstract
Discussed are recent efforts undertaken at the National Institute of Standards and Technology (NIST) to create a new set of high-resistance standards (specifically in the 10 MΩ to 100 MΩ range) using newer, more stable film-type resistors. The history of film-type resistors in high-resistance standards is briefly reviewed. Also examined are the improvements made upon similar resistance standard implementations done by the Instituto Nacional de Tecnología Industrial (INTI) in Argentina. The new NIST standards use a guarded, highly resistive backbone to reduce leakage currents. Promising results, including reduced settling time and improved stability, are presented.
Keywords
resistors; Instituto Nacional de Tecnologia Industrial; NIST; National Institute of Standards and Technology; film-type resistors; high-resistance standard resistors; high-resistance standards; Hermetic seals; Leakage current; Measurement standards; Moisture; NIST; Resistors; Spine; Stability; Surface resistance; Video recording;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location
Daejeon
Print_ISBN
978-1-4244-6795-2
Type
conf
DOI
10.1109/CPEM.2010.5543759
Filename
5543759
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