Title :
Recent radiation damage and single event effect results for microelectronics
Author :
O´Bryan, Martha V. ; LaBel, Kenneth A. ; Reed, Robert A. ; Howard, Jim W. ; Barth, Janet L. ; Seidleck, Christina M. ; Marshall, Paul W. ; Marshall, Cheryl J. ; Kim, Hak S. ; Hawkins, Donald K. ; Carts, Martin A. ; Forslund, Kurt E.
Author_Institution :
Raytheon Syst. Corp., Lanham, MD, USA
Abstract :
We present heavy ion and proton single event effects (SEE) as well as radiation damage ground test results for candidate spacecraft electronics. Microelectronics tested include digital, analog, and hybrid devices
Keywords :
analogue integrated circuits; digital integrated circuits; hybrid integrated circuits; integrated circuit testing; ion beam effects; proton effects; radiation hardening (electronics); semiconductor device testing; space vehicle electronics; analog devices; digital devices; heavy ion single event effect; hybrid devices; microelectronics; proton single event effect; radiation damage; radiation damage ground test; single event effect; spacecraft electronics; Clocks; Cyclotrons; Laboratories; Mesons; Microelectronics; Performance evaluation; Protons; Single event upset; Testing; User centered design;
Conference_Titel :
Radiation Effects Data Workshop, 1999
Conference_Location :
Norfolk, VA
Print_ISBN :
0-7803-5660-8
DOI :
10.1109/REDW.1999.816042
