• DocumentCode
    3468131
  • Title

    Radiation testing results of COTS based space microcircuits

  • Author

    Layton, P. ; Anthony, H. ; Boss, R. ; Hall, N. ; Hsu, P. ; Land, C. ; Meraz, F. ; LePage-Woodie, C. ; Luy, J. ; Strobel, D.

  • Author_Institution
    Space Electron. Inc., San Diego, CA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    53
  • Lastpage
    59
  • Abstract
    Single Event Effects and Total Ionizing dose data collected by SEi for Commercial off the Shelf (COTS) microcircuits are presented. The data was collected for evaluation of these devices for commercial space programs
  • Keywords
    integrated circuit testing; radiation hardening (electronics); space vehicle electronics; COTS space microcircuit; radiation testing; single event effect; total ionizing dose; Circuit testing; Cobalt; Cyclotrons; Integrated circuit testing; Laboratories; Manufacturing; Performance evaluation; Protection; Single event upset; Test facilities;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 1999
  • Conference_Location
    Norfolk, VA
  • Print_ISBN
    0-7803-5660-8
  • Type

    conf

  • DOI
    10.1109/REDW.1999.816057
  • Filename
    816057
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3468131