Title :
Device SEE susceptibility update: 1996-1998
Author :
Coss, J.R. ; Miyahira, T.F. ; Selva, L.E. ; Swift, G.M.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
This eighth Compendium continues the previous work of Nichols, et al., on single event effects (SEE) first published in 1985. Because the Compendium has grown so voluminous, this update only presents data not published in previous compendia
Keywords :
radiation hardening (electronics); SEE susceptibility; compendium; single event effect; Aerospace electronics; Aerospace testing; Conferences; Laboratories; Nuclear electronics; Power transistors; Propulsion; Protons; Radiation effects; Single event upset;
Conference_Titel :
Radiation Effects Data Workshop, 1999
Conference_Location :
Norfolk, VA
Print_ISBN :
0-7803-5660-8
DOI :
10.1109/REDW.1999.816058
