• DocumentCode
    3468152
  • Title

    Device SEE susceptibility update: 1996-1998

  • Author

    Coss, J.R. ; Miyahira, T.F. ; Selva, L.E. ; Swift, G.M.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    60
  • Lastpage
    81
  • Abstract
    This eighth Compendium continues the previous work of Nichols, et al., on single event effects (SEE) first published in 1985. Because the Compendium has grown so voluminous, this update only presents data not published in previous compendia
  • Keywords
    radiation hardening (electronics); SEE susceptibility; compendium; single event effect; Aerospace electronics; Aerospace testing; Conferences; Laboratories; Nuclear electronics; Power transistors; Propulsion; Protons; Radiation effects; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 1999
  • Conference_Location
    Norfolk, VA
  • Print_ISBN
    0-7803-5660-8
  • Type

    conf

  • DOI
    10.1109/REDW.1999.816058
  • Filename
    816058
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3468152