Title :
A radiation-hardened cold sparing input/output buffer manufactured on a commercial process line
Author :
Benedetto, J.M. ; Jordan, A.
Author_Institution :
UTMC Microelectron. Syst., Colorado Springs, CO, USA
Abstract :
The radiation hardness of a cold sparing buffer manufactured on a commercial process line is demonstrated. The buffer is shown to be resistant to total dose ionizing radiation and immune (>128 MeV-cm 2/mg) to effects from heavy ions such as single event upset (SEU) and single event latch-up (SEL)
Keywords :
buffer circuits; ion beam effects; radiation hardening (electronics); cold sparing input/output buffer; commercial manufacture; heavy ion irradiation; radiation hardness; single event latch-up; single event upset; total dose ionizing radiation; Impedance; Ionizing radiation; Manufacturing processes; Microelectronics; Redundancy; Single event upset; Springs; Substrates; Testing; Transceivers;
Conference_Titel :
Radiation Effects Data Workshop, 1999
Conference_Location :
Norfolk, VA
Print_ISBN :
0-7803-5660-8
DOI :
10.1109/REDW.1999.816060
