DocumentCode :
3468239
Title :
Rectification Characteristics in Saturated Molecular Junction
Author :
Dong, Hao ; Deng, Ning ; Zhang, Lei ; Ren, Min ; Chen, Peiyi
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing
fYear :
2006
fDate :
23-26 Oct. 2006
Firstpage :
1083
Lastpage :
1085
Abstract :
One of the molecular systems that has been studied extensively is saturated molecules, such as alkanethiol CH3(CH2) n-1-SH. In present paper, molecular junctions were constructed by using a sandwich structure that consists of metal electrode/self-assembled monolayers (SAM)/Au coated conducting-probe atomic force microscopy (CP-AFM) tip. The dependence of I-V characteristics on the length of molecules was investigated to explain electron transfer process in saturated molecules. Tunneling was confirmed as the dominant mechanism. Rectification effect was demonstrated in the sandwich structure, and possible explanation based on the tunneling model was proposed
Keywords :
atomic force microscopy; monolayers; rectification; sandwich structures; conducting-probe atomic force microscopy tip; electron transfer process; metal electrode; rectification characteristics; sandwich structure; saturated molecular junction; self-assembled monolayers; Atomic force microscopy; Atomic layer deposition; Electrodes; Electrons; Extraterrestrial measurements; Gold; Probes; Sandwich structures; Substrates; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
Type :
conf
DOI :
10.1109/ICSICT.2006.306688
Filename :
4098329
Link To Document :
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