• DocumentCode
    3468239
  • Title

    Rectification Characteristics in Saturated Molecular Junction

  • Author

    Dong, Hao ; Deng, Ning ; Zhang, Lei ; Ren, Min ; Chen, Peiyi

  • Author_Institution
    Inst. of Microelectron., Tsinghua Univ., Beijing
  • fYear
    2006
  • fDate
    23-26 Oct. 2006
  • Firstpage
    1083
  • Lastpage
    1085
  • Abstract
    One of the molecular systems that has been studied extensively is saturated molecules, such as alkanethiol CH3(CH2) n-1-SH. In present paper, molecular junctions were constructed by using a sandwich structure that consists of metal electrode/self-assembled monolayers (SAM)/Au coated conducting-probe atomic force microscopy (CP-AFM) tip. The dependence of I-V characteristics on the length of molecules was investigated to explain electron transfer process in saturated molecules. Tunneling was confirmed as the dominant mechanism. Rectification effect was demonstrated in the sandwich structure, and possible explanation based on the tunneling model was proposed
  • Keywords
    atomic force microscopy; monolayers; rectification; sandwich structures; conducting-probe atomic force microscopy tip; electron transfer process; metal electrode; rectification characteristics; sandwich structure; saturated molecular junction; self-assembled monolayers; Atomic force microscopy; Atomic layer deposition; Electrodes; Electrons; Extraterrestrial measurements; Gold; Probes; Sandwich structures; Substrates; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0160-7
  • Electronic_ISBN
    1-4244-0161-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.2006.306688
  • Filename
    4098329