Title :
Radiation evaluation of plastic encapsulated transistors and microcircuits for use in space applications
Author :
Gorelick, J.L. ; McClure, S.S. ; Swink, C.
Author_Institution :
Hughes Space & Commun. Co., Los Angeles, CA, USA
Abstract :
Radiation test results demonstrate the viability of selected PEMs devices for space use. The majority of the devices selected for evaluation are commercial equivalents of devices currently used on a number of satellites. Materials evaluations and charging experiments were also performed
Keywords :
bipolar transistors; encapsulation; integrated circuit testing; radiation hardening (electronics); semiconductor device testing; space vehicle electronics; plastic encapsulated microcircuit; plastic encapsulated transistor; radiation testing; space electronics; Ceramics; Circuit testing; Degradation; Integrated circuit testing; Manufacturing; Materials testing; Operational amplifiers; Plastic integrated circuit packaging; Plastic packaging; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 1999
Conference_Location :
Norfolk, VA
Print_ISBN :
0-7803-5660-8
DOI :
10.1109/REDW.1999.816063
