DocumentCode :
3468355
Title :
Optical Characteristics of Nano-crystalline Diamond Films as X-ray Lithography Masks for Integrated Circuit Fabrication
Author :
Wang, Lin-jun ; Liu, Jian-Min ; Su, Qing-Feng ; Xu, Run ; Peng, Hong-Yan ; Shi, Wei-Min ; Xia, Yi-Ben
Author_Institution :
Sch. of Mater. Sci. & Eng., Shanghai Univ.
fYear :
2006
fDate :
23-26 Oct. 2006
Firstpage :
1098
Lastpage :
1100
Abstract :
In this paper, the structure, morphology and optical properties of nano-crystalline diamond (NCD) films, deposited by hot-filament chemical vapor deposition (HFCVD) method under different carbon concentration, are investigated. With increasing the carbon concentration during the film deposition, the diamond grain size is reduced and thus a smooth diamond film can be obtained. According to the data on the absorption coefficient in the wavelength range from 200 to 1100 nm, the optical gap of the NCD films decreases from 4.3 eV to 3.2eV with increasing the carbon concentration from 2.0% to 3.0%
Keywords :
CVD coatings; X-ray lithography; diamond; integrated circuit technology; masks; nanostructured materials; optical properties; 200 to 1100 nm; X-ray lithography masks; absorption coefficient in; diamond grain size; film deposition; hot-filament chemical vapor deposition; integrated circuit fabrication; nanocrystalline diamond films; optical characteristics; optical gap; Absorption; Chemical vapor deposition; Diamond-like carbon; Grain size; Integrated optics; Morphology; Optical device fabrication; Optical films; Photonic integrated circuits; X-ray lithography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
Type :
conf
DOI :
10.1109/ICSICT.2006.306693
Filename :
4098334
Link To Document :
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