DocumentCode :
3468506
Title :
Modeling and electrostatic focusing for a field emission electron source
Author :
Jabotinski, Vadim ; Pasour, John ; Nguyen, Khanh T. ; Petillo, John ; Levush, Baruch ; Abe, D.
Author_Institution :
Vacuum Electron. Branch, U.S. Naval Res. Lab., Washington, DC, USA
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
1
Lastpage :
6
Abstract :
This paper presents theory and analysis of single-tip field emission and electron beam propagation in the electrostatic focusing fields. It is shown that two gate apertures with a focusing anode allow transport of narrow electron beams over long distances without need for a confining magnetic field. Physical mechanisms of the beam formation, transport, field emission energy distributions, the effects of the emission properties, and parametric studies are discussed, emission current formula is derived, and new concept and model of the bandgap-spread multilevel field emission is given.
Keywords :
electron beam focusing; electron sources; electrostatics; field emission; bandgap-spread multilevel field emission; beam formation; beam transport; electron beam propagation; electrostatic focusing fields; emission current formula; emission properties; field emission electron source; field emission energy distributions; focusing anode; gate apertures; narrow electron beams; parametric studies; physical mechanisms; single-tip field emission; Anodes; Current density; Electric fields; Electron beams; Focusing; Geometry; Logic gates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference (PPC), 2013 19th IEEE
Conference_Location :
San Francisco, CA
ISSN :
2158-4915
Type :
conf
DOI :
10.1109/PPC.2013.6627571
Filename :
6627571
Link To Document :
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