Title :
Design of an advanced modular automated evaluation system for experimental high power SGTOs
Author :
Lacouture, Shelby ; Lawson, Kevin ; Bayne, Stephen ; Giesselmann, Michael ; O´Brien, Heather ; Ogunniyi, Aderinto ; Scozzie, C.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Tech Univ., Lubbock, TX, USA
Abstract :
An advanced evaluation system for experimental high power Super Gate Turn Off Thyristors (SGTOs) with built - in custom data acquisition and characterization electronics was designed and built in a cooperative agreement between engineers at Texas Tech University´s Center for Pulsed Power and Power electronics (P3 E) laboratory and research scientists at Army Research Lab (ARL). The system consist of a Pulse Forming Network (PFN) energized by a rapid capacitor charger, a data acquisition system which records chosen waveforms for each test cycle and a curve tracing module which the test devices are mechanically switched into to record current and voltage characteristics at arbitrary intervals between high power cycles. Testing is completely automated, with all test parameters including charge level, repetition rate, volume, etc. set within a windows based GUI. The evaluation system has successfully recorded changing I - V characteristics before actual physical failure in several devices. Extremely high volume testing has also been carried out with one device having been cycled over 42,000 times at moderate (2.5 kA) conduction levels.
Keywords :
capacitors; data acquisition; graphical user interfaces; thyristors; ARL; Army Research Lab; Center for P3E; Center for Pulsed Power and Power electronics; GUI-based windows; I-V characteristics; PFN; Texas Tech University; advanced modular automated evaluation system; capacitor charger; characterization electronics; conduction levels; cooperative agreement; current 2.5 kA; current characteristics; curve tracing module; custom data acquisition; experimental high power SGTOS; high power cycles; high power super gate turn off thyristors; high volume testing; physical failure; pulse forming network; voltage characteristics; Capacitors; Computers; Logic gates; Silicon; Silicon carbide; Switches; Testing;
Conference_Titel :
Pulsed Power Conference (PPC), 2013 19th IEEE
Conference_Location :
San Francisco, CA
DOI :
10.1109/PPC.2013.6627575