DocumentCode :
3468893
Title :
Adaptive online testing for efficient hard fault detection
Author :
Gupta, Shantanu ; Ansari, Amin ; Feng, Shuguang ; Mahlke, Scott
Author_Institution :
Adv. Comput. Archit. Lab., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2009
fDate :
4-7 Oct. 2009
Firstpage :
343
Lastpage :
349
Abstract :
With growing semiconductor integration, the reliability of individual transistors is expected to rapidly decline in future technology generations. In such a scenario, processors would need to be equipped with fault tolerance mechanisms to tolerate in-field silicon defects. Periodic online testing is a popular technique to detect such failures; however, it tends to impose a heavy testing penalty. In this paper, we propose an adaptive online testing framework to significantly reduce the testing overhead. The proposed approach is unique in its ability to assess the hardware health and apply suitably detailed tests. Thus, a significant chunk of the testing time can be saved for the healthy components. We further extend the framework to work with the StageNet CMP fabric, which provides the flexibility to group together pipeline stages with similar health conditions, thereby reducing the overall testing burden. For a modest 2.6% sensor area overhead, the proposed scheme was able to achieve an 80% reduction in software test instructions over the lifetime of a 16-core CMP.
Keywords :
circuit reliability; circuit testing; multiprocessing systems; transistors; StageNet CMP fabric; adaptive online testing; fault tolerance; hard fault detection; in-field silicon defect tolerance; semiconductor integration; software test instructions; transistor reliability; CMOS technology; Checkpointing; Fault detection; Hardware; Logic; Pipelines; Proposals; Redundancy; Silicon; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design, 2009. ICCD 2009. IEEE International Conference on
Conference_Location :
Lake Tahoe, CA
ISSN :
1063-6404
Print_ISBN :
978-1-4244-5029-9
Electronic_ISBN :
1063-6404
Type :
conf
DOI :
10.1109/ICCD.2009.5413132
Filename :
5413132
Link To Document :
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