DocumentCode :
3468904
Title :
Probe response to a non-uniform E-field in a TEM cell
Author :
Morioka, T.
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
327
Lastpage :
328
Abstract :
An ordinary calibration of an E-field probe using a TEM waveguide is carried out by assuming an ideal plane E-field incidence onto the probe. However, the E-field of a TEM cell does not have such an ideal field uniformity. In the present paper, the field distribution of a TEM cell is simulated by using a numerical method and responses of a short dipole probe to the calculated non-uniform E-field are investigated.
Keywords :
TEM cells; calibration; probes; waveguides; E-field probe; TEM cell; TEM waveguide; dipole probe; nonuniforM E-field; probe response; Analytical models; Calibration; Electromagnetic measurements; Electromagnetic waveguides; NIST; Planar waveguides; Probes; Surface impedance; TEM cells; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
Type :
conf
DOI :
10.1109/CPEM.2010.5543818
Filename :
5543818
Link To Document :
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