DocumentCode :
3469116
Title :
A voltage scale for electro-thermal runaway
Author :
Lau, Y.Y. ; Chernin, D. ; Peng Zhang ; Gilgenbach, Ronald M.
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
1
Lastpage :
2
Abstract :
A voltage scale, Vs that characterizes electro-thermal runaway, is deduced from the heat conduction equation, Vs = √k/σ´0, where k-is the thermal conductivity and σ´0 is the rate of change of the electrical conductivity with respect to temperature. Vs depends only on material properties and is independent of geometry and the operating voltage. Vs measures the intrinsic tolerance of the material to electro-thermal instability. Numerical values of Vs are consistent with the well-known properties of several common materials.
Keywords :
electrical conductivity; heat conduction; thermal conductivity; electrical conductivity; electro-thermal runaway; heat conduction equation; material properties; thermal conductivity; voltage scale; Conductivity; Contacts; Equations; Geometry; Heating; Materials; Plasma temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference (PPC), 2013 19th IEEE
Conference_Location :
San Francisco, CA
ISSN :
2158-4915
Type :
conf
DOI :
10.1109/PPC.2013.6627601
Filename :
6627601
Link To Document :
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