Title :
Low-overhead error detection for Networks-on-Chip
Author :
Berman, Amit ; Keidar, Idit
Author_Institution :
Dept. of Electr. Eng., Technion - Israel Inst. of Technol., Haifa, Israel
Abstract :
In the current deep sub-micron age, interconnect reliability is a subject of major concern, and is crucial for a successful product. Coding is a widely-used method to achieve communication reliability, which can be very useful in a network-on-chip (NoC). A key challenge for NoC error detection is to provide a defined detection level, while minimizing the number of redundant parity bits, using small encoder and decoder circuits, and ensuring shortest path routing. We present parity routing (PaR), a novel method to reduce the number of redundant bits transmitted. PaR exploits NoC path diversity to reduce the number of redundant parity bits. Our analysis shows that, for example, on a 4Ã4 NoC with a demand of one parity bit, PaR reduces the redundant information transmitted by 75%, and the savings increase asymptotically to 100% with the size of the NoC. In addition, we show that PaR can yield power savings due to the reduced number of bit transmissions and simple decoding process. Furthermore, PaR utilizes low complexity, small-area circuits.
Keywords :
circuit reliability; network routing; network-on-chip; communication reliability; interconnect reliability; low-overhead error detection; networks-on-chip; parity routing; Costs; Decoding; Information analysis; Integrated circuit interconnections; Network-on-a-chip; Physical layer; Protection; Routing; Telecommunication network reliability; Wires;
Conference_Titel :
Computer Design, 2009. ICCD 2009. IEEE International Conference on
Conference_Location :
Lake Tahoe, CA
Print_ISBN :
978-1-4244-5029-9
Electronic_ISBN :
1063-6404
DOI :
10.1109/ICCD.2009.5413150