DocumentCode
3469401
Title
A distributed concurrent on-line test scheduling protocol for many-core NoC-based systems
Author
Lee, Jason D. ; Mahapatra, Rabi N. ; Bhojwani, Praveen S.
Author_Institution
Texas A&M Univ., College Station, TX, USA
fYear
2009
fDate
4-7 Oct. 2009
Firstpage
179
Lastpage
185
Abstract
Concurrent on-line testing (COLT) of many-core systems-on-chip (SoC) has been recently proposed by researchers in response to the growing threat of electronic wear-out to system operational lifetimes and to the increasing reliability and availability demands of safety-critical applications. Previous research in concurrent on-line testing has focused on centralized approaches to manage core testing while the system is available to execute normal user applications. However, as technology scaling allows dozens and hundreds of processing cores to be placed on a single chip, these centralized approaches are not scalable solutions. In this paper, a distributed concurrent on-line test scheduling protocol is proposed and evaluated against previously developed solutions. Our experiments show that a distributed COLT scheduler can test a moderately-sized SoC with a speedup of 3.85 over centralized approaches while consuming 84% less energy, and performance benefits improve as the number of cores per chip increases. This research also presents a core test ordering algorithm - Code-Division Core Test Scheduling - that provides an additional 40% reduction in system test latency compared to other schedulers.
Keywords
integrated circuit testing; network-on-chip; protocols; scheduling; NoC-based systems; availability demands; code-division core test scheduling; distributed COLT scheduler; distributed concurrent on-line test scheduling protocol; electronic wear-out; reliability demands; safety-critical applications; systems-on-chip; Built-in self-test; Circuit testing; Delay; Electronic equipment testing; Energy consumption; Job shop scheduling; Life testing; Network-on-a-chip; Protocols; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design, 2009. ICCD 2009. IEEE International Conference on
Conference_Location
Lake Tahoe, CA
ISSN
1063-6404
Print_ISBN
978-1-4244-5029-9
Electronic_ISBN
1063-6404
Type
conf
DOI
10.1109/ICCD.2009.5413156
Filename
5413156
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