DocumentCode :
3469403
Title :
Modeling mutually exclusive events in fault trees
Author :
Twigg, David W. ; Ramesh, Anapathur V. ; Sandadi, Upender R. ; Sharma, Tilak C.
Author_Institution :
Boeing Co., Seattle, WA, USA
fYear :
2000
fDate :
2000
Firstpage :
8
Lastpage :
13
Abstract :
A method is given for constructing fault tree gates to model mutually exclusive events. The gates are constructed from stochastically independent events, AND gates and NOT gates. Examples are presented to illustrate the technique. If the gate construction must be performed manually, the method adds complexity to the fault tree model that may not be justified. Approximating mutually exclusive events by independent events may have little effect on computed gate probabilities. The method could easily be automated in a standard fault tree solver so that this gate construction goes on behind the scenes. This would permit users to specify disjoint events directly. The authors conjecture that the additional computational cost would be small, since the number of basic events in the tree does not increase and the new NOT gates are inserted at the bottom of the tree
Keywords :
fault trees; logic gates; probability; AND gates; NOT gates; computational cost; fault tree; fault tree gates construction; gate probabilities computation; mutually exclusive events modelling; standard fault tree solver; stochastically independent events; Computational efficiency; Fault trees; Layout; Logic; Probability; Relays; State-space methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2000. Proceedings. Annual
Conference_Location :
Los Angeles, CA
ISSN :
0149-144X
Print_ISBN :
0-7803-5848-1
Type :
conf
DOI :
10.1109/RAMS.2000.816276
Filename :
816276
Link To Document :
بازگشت