Title :
Measurement techniques for smart sensor interfaces implemented in CMOS technology
Author :
Meijer, G.C.M. ; Xiujun, Li
Author_Institution :
Fac. EEMCS, Delft Univ. of Technol.
Abstract :
The paper reviews how the application of appropriate measurement and signal-processing techniques can improve the accuracy of smart sensor systems. The smart sensor systems under consideration consist of a number of multiplexed sensor elements, sensor-specific front-ends, modifiers and a microcontroller or a digital signal processor (DSP). It is shown that in an overall design approach the availability of memory and calculation functions enables the application of powerful measurement methods, such as chopping, auto calibration, dynamic element matching and dynamic division. It is shown, that these techniques are rather suited for implementation in CMOS integrated circuits, where they can solve the traditional problems caused by component mismatching and 1/f noise
Keywords :
1/f noise; CMOS integrated circuits; digital signal processing chips; intelligent sensors; microcontrollers; 1/f noise; CMOS integrated circuits; CMOS technology; component mismatching; digital signal processor; dynamic element matching; microcontroller; multiplexed sensor elements; sensor-specific front-ends; signal-processing; smart sensor interfaces; smart sensor systems; CMOS integrated circuits; CMOS technology; Calibration; Digital signal processing; Digital signal processors; Integrated circuit measurements; Intelligent sensors; Measurement techniques; Microcontrollers; Sensor systems;
Conference_Titel :
ASIC, 2005. ASICON 2005. 6th International Conference On
Conference_Location :
Shanghai
Print_ISBN :
0-7803-9210-8
DOI :
10.1109/ICASIC.2005.1611414