• DocumentCode
    3469500
  • Title

    Design and implementation of DFT strategy in ASIC design of resilient packet ring

  • Author

    Zhang, Fan ; Li, Jishi ; Chen, Hong ; Jin, Depeng ; Zeng, Lieguang

  • Author_Institution
    Dept. of Electron. Eng., Tsinghua Univ., Beijing
  • Volume
    2
  • fYear
    2005
  • fDate
    24-0 Oct. 2005
  • Firstpage
    689
  • Lastpage
    693
  • Abstract
    According to the practical test requirements of resilient packet ring (RPR) application specific integrated circuit (ASIC), design for testability (DFT) strategy that applies three different DFT methods compositively is proposed in this paper. Principles and key methods used in the strategy are introduced, including scan chain, boundary scan test (BST), memory built-in-self-test (MBIST). Implementation process and results of the DFT strategy are analyzed in detail. DFT circuits implemented in RPR ASIC have reduced the difficulty of test and improved fault coverage a lot. Adopting DFT techniques logically and compositively is very important
  • Keywords
    application specific integrated circuits; boundary scan testing; built-in self test; design for testability; ASIC design; DFT strategy; application specific integrated circuit design; boundary scan test; design for testability; memory built-in-self-test; resilient packet ring; scan chain; Application specific integrated circuits; Bandwidth; Binary search trees; Circuit testing; Design engineering; Design for testability; Integrated circuit testing; Logic testing; Signal design; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2005. ASICON 2005. 6th International Conference On
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-9210-8
  • Type

    conf

  • DOI
    10.1109/ICASIC.2005.1611415
  • Filename
    1611415