DocumentCode
3469500
Title
Design and implementation of DFT strategy in ASIC design of resilient packet ring
Author
Zhang, Fan ; Li, Jishi ; Chen, Hong ; Jin, Depeng ; Zeng, Lieguang
Author_Institution
Dept. of Electron. Eng., Tsinghua Univ., Beijing
Volume
2
fYear
2005
fDate
24-0 Oct. 2005
Firstpage
689
Lastpage
693
Abstract
According to the practical test requirements of resilient packet ring (RPR) application specific integrated circuit (ASIC), design for testability (DFT) strategy that applies three different DFT methods compositively is proposed in this paper. Principles and key methods used in the strategy are introduced, including scan chain, boundary scan test (BST), memory built-in-self-test (MBIST). Implementation process and results of the DFT strategy are analyzed in detail. DFT circuits implemented in RPR ASIC have reduced the difficulty of test and improved fault coverage a lot. Adopting DFT techniques logically and compositively is very important
Keywords
application specific integrated circuits; boundary scan testing; built-in self test; design for testability; ASIC design; DFT strategy; application specific integrated circuit design; boundary scan test; design for testability; memory built-in-self-test; resilient packet ring; scan chain; Application specific integrated circuits; Bandwidth; Binary search trees; Circuit testing; Design engineering; Design for testability; Integrated circuit testing; Logic testing; Signal design; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2005. ASICON 2005. 6th International Conference On
Conference_Location
Shanghai
Print_ISBN
0-7803-9210-8
Type
conf
DOI
10.1109/ICASIC.2005.1611415
Filename
1611415
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