DocumentCode :
3469516
Title :
Switching characteristic of Si-IEGTs and SiC-PiN diodes pair connected in series
Author :
Sung, Kyungmin ; Akiyama, Hironobu ; Takao, Kazuto ; Kanai, Takeo ; Tanaka, Yasunori ; Ohashi, Hiromichi
Author_Institution :
Ibaraki Nat. Coll. of Technol., Hitachinaka, Japan
fYear :
2010
fDate :
21-24 June 2010
Firstpage :
150
Lastpage :
175
Abstract :
In this paper, in order to realize high voltage static switches of voltage source inverters in high power applications, two series connected 4.5kV rate Si-IEGT with SiC-PiN diode pairs (hybrid combination) are considered with hard switching method. The switching test of power module that is hybrid combination is carried out under 5kV DC bias voltage. The gate driver circuit is designed by high output power capacity for high speed hard switching. Small reverse recovery charge of SiC-PiN diode and the hard switching method are adopted for the purpose of not only high switching frequency but also high power density in the high power converter system. Experimental results show good switching characteristic of voltage balancing with small size capacitor and balance resistors at the switching period.
Keywords :
elemental semiconductors; field effect transistors; invertors; p-i-n diodes; power semiconductor switches; silicon; silicon compounds; wide band gap semiconductors; IEGT; PIN diodes; Si; SiC; balance resistors; hard switching method; high voltage static switch; injection enhanced gate transistor; switching characteristic; switching test; voltage 4.5 kV; voltage 5 kV; voltage source inverter; Circuit testing; Diodes; Driver circuits; Inverters; Multichip modules; Power generation; Switches; Switching circuits; Switching frequency; Voltage; Series connection; Si-IEGT; SiC-PiN diode; high power and voltage application;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Conference (IPEC), 2010 International
Conference_Location :
Sapporo
Print_ISBN :
978-1-4244-5394-8
Type :
conf
DOI :
10.1109/IPEC.2010.5543850
Filename :
5543850
Link To Document :
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