An optical streak diagnostic for observing anode-cathode plasmas for radiographic source development

Author

Droemer, Darryl W. ; Crain, Marlon D. ; Lare, Gregory A. ; Bennett, Nichelle ; Johnston, Mark D.

Author_Institution

Nat. Security Technol., LLC, Las Vegas, NV, USA

fYear

2013

fDate

16-21 June 2013

Firstpage

1

Lastpage

6

Abstract

National Security Technologies and Sandia National Laboratories are collaborating in the research and development of pulsed-power-driven intense electron beam sources for x-ray radiography. These diode sources typically generate electrode plasmas with densities of 10¹³-10¹⁷ cm^-3, and understanding these plasmas is critical for optimizing the radiographic performance. NSTec has developed and fielded two systems which provide temporally and spatially resolved measurements of plasma density distributions. Details of the hardware are provided along with example measurement results.

Keywords

plasma X-ray sources; plasma density; plasma diagnostics; plasma diodes; plasma sources; radiography; NSTec; National Security Technologies; Sandia National Laboratories; anode-cathode plasmas; diode sources; electrode plasmas; optical streak diagnostic; plasma density distributions; pulsed-power-driven intense electron beam sources; radiographic source development; spatially resolved measurement; temporally resolved measurement; x-ray radiography; Anodes; Cameras; Cathodes; Optical imaging; Plasmas; Spatial resolution;

fLanguage

English

Publisher

ieee

Conference_Titel

Pulsed Power Conference (PPC), 2013 19th IEEE

Conference_Location

San Francisco, CA

ISSN

2158-4915

Type

conf

DOI

10.1109/PPC.2013.6627628

Filename

6627628