Title :
A P1500-compliant wrapper and TAM controller co-design scheme
Author :
Chao, Wu ; Hong, Wang ; Shiyuan, YANG
Author_Institution :
Dept. of Autom., Tsinghua Univ., Beijing
Abstract :
IEEE P1500 is a standard under development which intends to improve ease of test reuse and test integration with respect to the core-based SoCs. This paper proposes a P1500-compliant wrapper and TAM controller design scheme. Area overhead and power consumption are taken into account in our scheme. Some experiment results based on a sample SoC are reported, showing the effectiveness of the proposed approach in terms of area overhead
Keywords :
IEEE standards; integrated circuit testing; logic testing; microcontrollers; system-on-chip; IEEE P1500; P1500-compliant wrapper; TAM controller co-design; core-based SoC; system-on-chip; test integration; test reuse; Automata; Bandwidth; Chaos; Control systems; Costs; Energy consumption; Scalability; Standards development; Testing; Timing;
Conference_Titel :
ASIC, 2005. ASICON 2005. 6th International Conference On
Conference_Location :
Shanghai
Print_ISBN :
0-7803-9210-8
DOI :
10.1109/ICASIC.2005.1611419
