Title :
High temperature high voltage packaging of wideband gap semiconductors using gas insulating medium
Author :
Lebey, Thierry ; Omura, Ichiro ; Kozako, Masahiro ; Kawano, Hiroki ; Hikita, Masayuki
Author_Institution :
Paul Sabatier Univ., Toulouse, France
Abstract :
Using wideband gap semiconductors (SiC, GaN) appear as possible solution to the growing demand for the development of high temperature power electronics. These devices are devoted to work in harsh environments mainly for "on board applications" like automobile, aircraft and space exploration. In some cases, high temperature is associated to the environment itself (when the converter is located in the vicinity of a thermal engine for example) but in other, it is only related to the increase of the power density associated to power integration. However, the opportunities given by these wideband gap semiconductors devices may be reduced since their packages are inadequate as regards insulation, interconnection and thermal management under high-temperature operations and environments. The aim of this paper is to present the results obtained concerning the insulating parts of this packaging, mainly secondary passivation and encapsulation in a 200-450°C temperature range. Gas insulation is used and this original solution is examined for different gases and conditions.
Keywords :
electronics packaging; high-temperature electronics; high-voltage techniques; power semiconductor devices; wide band gap semiconductors; gas insulating medium; high temperature high voltage packaging; high temperature power electronics; power density; wideband gap semiconductors; Electronic packaging thermal management; Electronics packaging; Gallium nitride; Gas insulation; Semiconductor device packaging; Silicon carbide; Temperature; Thermal management; Voltage; Wideband; Packaging; high temperature; wide band gap semiconductor devices;
Conference_Titel :
Power Electronics Conference (IPEC), 2010 International
Conference_Location :
Sapporo
Print_ISBN :
978-1-4244-5394-8
DOI :
10.1109/IPEC.2010.5543854