• DocumentCode
    3469644
  • Title

    Body current model for Drift Drain Mosfet

  • Author

    Bolin, Shuai ; Ziou, Wang ; Xiaojin, Guan

  • Author_Institution
    Dept. of Microelectron., Soochow Univ., Suzhou
  • fYear
    2006
  • fDate
    23-26 Oct. 2006
  • Firstpage
    1355
  • Lastpage
    1357
  • Abstract
    In this paper, characteristics of drift drain MOSFET are simulated and analysed with the device simulation software Medici. Electric field model for drift region is proposed and body current model is obtained
  • Keywords
    MOSFET; electric fields; semiconductor device models; Medici; body current model; device simulation; drift drain MOSFET; drift region; electric field model; Analytical models; CMOS technology; Circuit simulation; Doping; Electron mobility; MOSFET circuits; Medical simulation; Neodymium; Semiconductor device modeling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0160-7
  • Electronic_ISBN
    1-4244-0161-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.2006.306159
  • Filename
    4098407