Design of a paraxial inverse Compton scattering diagnostic for an intense relativistic electron beam

Author

Coleman, J.E. ; Oertel, J.A. ; Ekdahl, C.A. ; Shaw, Dominick ; Archuleta, T.N. ; Moir, D.C. ; McCuistian, B.T. ; Crawford, M.T. ; Platonov, Y.

Author_Institution

Los Alamos Nat. Lab., Los Alamos, NM, USA

fYear

2013

fDate

16-21 June 2013

Firstpage

1

Lastpage

6

Abstract

An inverse Compton scattering diagnostic is currently being developed for an 80 ns, intense relativistic electron bunch with an energy of 19.8 MeV and nominal current of 1.7 kA. The principal purpose of this diagnostic is to provide a measurement of the 6-D phase space distribution of the electron beam in a single shot without disrupting its axial propagation. The electron beam is intercepted by 450 mJ of green light, which is upscattered into the soft X-ray range by the relativistic electrons. The diverging, scattered photons are diffracted onto an X-ray framing camera by an X-ray crystal concentric to the beam pipe utilizing an elongated von Hamos geometry [1]. The experimental configuration is presented, which includes the electron and photon interaction dynamics, crystal design, X-ray framing camera design, and the expected time resolved longitudinal and transverse distributions.

Keywords

Compton effect; cameras; electron beams; X-ray crystal; X-ray framing camera; axial propagation; beam pipe; current 1.7 kA; electron interaction dynamics; electron volt energy 19.8 MeV; elongated von Hamos geometry; paraxial inverse Compton scattering diagnostic; photon interaction dynamics; relativistic electron beam; scattered photons; time resolved longitudinal distributions; time resolved transverse distributions; Crystals; Electron beams; Laser beams; Measurement by laser beam; Photonics; Scattering; X-ray lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Pulsed Power Conference (PPC), 2013 19th IEEE

Conference_Location

San Francisco, CA

ISSN

2158-4915

Type

conf

DOI

10.1109/PPC.2013.6627645

Filename

6627645