Title :
A study on the factors influencing license income of technology commercialization in United States Universities
Author :
Ken, Yun ; Hsu, Wen-Ling ; Tsai, Tung-Yu
Author_Institution :
Nat. Yunlin Univ. of Sci. & Technol., Douliou, Taiwan
Abstract :
Although high-tech industries and academics have the capability of research and development for technologies, the capability of technology commercialization is considered to be more important. If they only do R&D without commercialization, it might lead to no returns. Due to the spur of US governmental policies, research-oriented purposes in universities are switched to industrial purposes instead of science purposes. After the Bayh-Dole Act was enacted in 1980, the activities of technology transfer between academics and industries dramatically boosted. The factors, which influence the performances of technology transfer, were proposed by some pervious researches, and most of them suggested that researches expenditure, patents, and published articles carry significant weight. According to some case studies of famous journal, they pointed out that patents have no contribution. This study uses AUTM licensing survey to figure out the relationship between issued patents, published articles, and technology commercialization. The result of the study shows that published articles do have an effect, but issued patents do not make a significant effect on technology commercialization.
Keywords :
educational institutions; research and development; technology transfer; Bayh-Dole Act; US governmental policies; United States Universities; industrial purposes; research and development; research-oriented purposes; technology commercialization; technology transfer; Business; Commercial law; Commercialization; Educational institutions; Licenses; Production; Research and development; Technology management; Technology transfer; Trademarks;
Conference_Titel :
Management of Engineering & Technology, 2009. PICMET 2009. Portland International Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-890843-20-5
Electronic_ISBN :
978-1-890843-20-5
DOI :
10.1109/PICMET.2009.5261806