Title :
A simultaneous multichannel recording obtained from rat cortex using a plasma etched silicon depth probe
Author :
Hwang, E. ; Kim, S. ; Yoon, T. ; Shin, D. ; Oh, S. ; Jung, S. ; Shin, H.
Author_Institution :
Dept. of Electr. Eng., Seoul Nat. Univ., South Korea
Abstract :
Combination of plasma and wet etching was done in developing a new silicon depth-probe type microelectrode array. The plasma etch uses low temperature oxide (LTO) mask instead of thick photoresist mask, and enables the thickness of the probe shank to be defined more freely and in wider range. The entire probe shaping process was performed only at low temperature, and is CMOS compatible. A probe with 30 μm shank thickness was successfully used in recording from rat´s somatosensory cortex. A four-channel simultaneous neural recording shows signal-to-noise ratio performance comparable with that obtained using conventional microprobes
Keywords :
biomedical electrodes; brain; elemental semiconductors; microelectrodes; silicon; sputter etching; Si; low temperature oxide mask; microelectrode array; plasma etching; rat somatosensory cortex; shank shaping; signal-to-noise ratio; silicon depth probe; simultaneous multichannel neural recording; wet etching; CMOS process; Microelectrodes; Plasma applications; Plasma temperature; Probes; Resists; Signal to noise ratio; Silicon; Temperature distribution; Wet etching;
Conference_Titel :
[Engineering in Medicine and Biology, 1999. 21st Annual Conference and the 1999 Annual Fall Meetring of the Biomedical Engineering Society] BMES/EMBS Conference, 1999. Proceedings of the First Joint
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-5674-8
DOI :
10.1109/IEMBS.1999.802457