• DocumentCode
    3470485
  • Title

    A 15 b 5 MSample/s low-spurious CMOS ADC

  • Author

    Sung-Ung Kwak ; Bang-Sup Song ; Bacrania, K.

  • Author_Institution
    Illinois Univ., Urbana, IL, USA
  • fYear
    1997
  • fDate
    8-8 Feb. 1997
  • Firstpage
    146
  • Lastpage
    147
  • Abstract
    This 15b CMOS ADC at 5MSample/s has four stages with 5, 5, 5, and 6b each. The number of bits resolved per stage is set higher to achieve the same resolution with less accurate components. Resolving more bits per stage greatly simplifies op amp design and reduces the initial capacitor matching requirement. Furthermore, residue amplifiers with low feedback factors are less sensitive to summing-node parasitics. The first two 5b stages are calibrated using the remaining part of the ADC. Two stages are selected for calibration. The gain ofthe 5b residue amplifier is set to 16 to make room for digital correction. After digital correction, the chip has an 18b output. Performance up to 16b level can be tested after removing 2 LSBs corrupted by digital processing. System partitioning and multi-stage calibration solve two fundamental problems of capacitor matching and finite opamp gain.
  • Keywords
    BiCMOS integrated circuits; CMOS integrated circuits; analogue-digital conversion; calibration5602194; circuit feedback; harmonic distortion; operational amplifiers; sample and hold circuits; 15 bit; calibration; capacitor matching; digital correction; feedback factors; finite opamp gain; initial capacitor matching requirement; low-spurious CMOS ADC; multi-stage calibration; op amp design; residue amplifiers; resolution; summing-node parasitics; system partitioning; Calibration; Capacitors; Clocks; Feedback; Frequency; Interpolation; Linearity; Operational amplifiers; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1997. Digest of Technical Papers. 43rd ISSCC., 1997 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0193-6530
  • Print_ISBN
    0-7803-3721-2
  • Type

    conf

  • DOI
    10.1109/ISSCC.1997.585309
  • Filename
    585309